Variable moving windows based non-Gaussian dissimilarity analysis technique for batch processes fault detection and diagnosis

Canadian Journal of Chemical Engineering

Volumn 93, Issue 4, 2015, Pages 689-707

  Li, Yuan ^a   Zhang, Xinmin ^a  

^a SHENYANG UNIVERSITY OF CHEMICAL TECHNOLOGY   (China)

Author keywords

Batch processes; Fault detection and diagnosis; Independent component analysis; Non Gaussian dissimilarity analysis; Variable moving windows

Indexed keywords

BATCH DATA PROCESSING; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); INDEPENDENT COMPONENT ANALYSIS; MICA; PROCESS CONTROL; PROCESS MONITORING;

BATCH PROCESS; DISSIMILARITY ANALYSIS; FAULT DETECTION AND DIAGNOSIS; INDEPENDENT COMPONENT ANALYSIS(ICA); ON-LINE PROCESS MONITORING; PENICILLIN FERMENTATION PROCESS; RELIABILITY AND VALIDITY; VARIABLE MOVING WINDOW;

FAULT DETECTION;

EID: 84924962136     PISSN: 00084034     EISSN: 1939019X     Source Type: Journal    
DOI: 10.1002/cjce.22162     Document Type: Article

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