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Volumn 90, Issue , 2015, Pages 118-132

The process of solid-state dewetting of Au thin films studied by in situ scanning transmission electron microscopy

Author keywords

Image analysis; Morphology; Solid state dewetting; Temporal evolution; Thin films

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS FILMS; AMORPHOUS SILICON; ELECTRON MICROSCOPY; IMAGE ANALYSIS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE; THICK FILMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84924244242     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2015.01.072     Document Type: Article
Times cited : (79)

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