Microstructure evolution during dewetting in thin Au films

Acta Materialia

Volumn 58, Issue 18, 2010, Pages 6035-6045

  Müller, Claudia Manuela ^a   Spolenak, Ralph ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Annealing; Electron backscatter diffraction; Texture; Thin films; Wetting

Indexed keywords

ANNEALING; BACKSCATTERING; DIFFRACTION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; MICROSTRUCTURE; TEXTURES; THIN FILMS; WETTING;

ELECTRON BACK SCATTER DIFFRACTION; ENERGY MINIMIZATION; HIGH ANGLE GRAIN BOUNDARIES; MICRO-STRUCTURE EVOLUTIONS; THIN METAL FILMS; VOID COALESCENCE; VOID GROWTH; VOID INITIATION;

GOLD;

EID: 79952360736     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.07.021     Document Type: Article

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