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Volumn 74, Issue , 2014, Pages 30-38
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Solid state dewetting and stress relaxation in a thin single crystalline Ni film on sapphire
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Author keywords
Atomic force microscopy; Capillary phenomena; Dislocations; Stress and strain; Thin films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLINE MATERIALS;
DISLOCATIONS (CRYSTALS);
NICKEL;
SAPPHIRE;
SURFACE TOPOGRAPHY;
THIN FILMS;
CAPILLARY PHENOMENA;
CHANNEL INSTABILITIES;
HEXAGONAL PATTERN;
HIERARCHICAL SURFACES;
ORIENTATION RELATIONSHIP;
SAPPHIRE SUBSTRATES;
SINGLE-CRYSTALLINE;
STRESS AND STRAIN;
TOPOGRAPHY;
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EID: 84899664797
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2014.04.020 Document Type: Article |
Times cited : (54)
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References (37)
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