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Volumn 31, Issue 1, 2015, Pages 16-32

Stochastic modelling and analysis of degradation for highly reliable products

Author keywords

Data driven methods; Degradation based burn in; General path models; Stochastic process models; Wiener processes

Indexed keywords

DECISION MAKING; RANDOM PROCESSES; STOCHASTIC SYSTEMS;

EID: 84923355419     PISSN: 15241904     EISSN: 15264025     Source Type: Journal    
DOI: 10.1002/asmb.2063     Document Type: Article
Times cited : (186)

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