Optimal burn-in time for highly reliable products

International Journal of Industrial Engineering : Theory Applications and Practice

Volumn 8, Issue 4, 2001, Pages 329-338

  Tseng, S T ^a   Tang, J ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Burn in Test; Degradation Model; Highly Reliable Products; Mean Residual Lifetime (MRL); Termination Time; Wiener Process

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; INDUSTRIAL ECONOMICS; MATERIALS TESTING; OPERATIONS RESEARCH; QUALITY ASSURANCE;

BURN-IN TESTS;

PRODUCT LIABILITY;

EID: 0035673922     PISSN: 10724761     EISSN: 1943670X     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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13. Designing a degradation experiment