Accelerated degradation-tests with tightened critical values

IEEE Transactions on Reliability

Volumn 51, Issue 4, 2002, Pages 463-468

  Yang, Guangbin ^a,b   Yang, Kai ^a,c  

^a IEEE   (United States)

^b FORD MOTOR COMPANY   (United States)

^c Wayne State University   (United States)

Author keywords

Accelerated degradation test; Critical value; Optimum test plan; Performance characteristic; Sensitivity analysis

Indexed keywords

ACCELERATED DEGRADATION TEST; CRITICAL VALUE; OPTIMUM TEST-PLAN;

ASYMPTOTIC STABILITY; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; MECHANICAL TESTING; PERFORMANCE; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; SENSITIVITY ANALYSIS; SERVICE LIFE; STRESSES;

RELIABILITY;

EID: 0036891325     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.804490     Document Type: Article

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