The inverse gaussian process as a degradation model

Technometrics

Volumn 56, Issue 3, 2014, Pages 302-311

  Ye, Zhi Sheng ^a   Chen, Nan ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Compound Poisson approximation; Explanatory variables; Monotone degradation paths; Random effects; Wiener process

Indexed keywords

POISSON DISTRIBUTION;

COMPOUND POISSON; EXPLANATORY VARIABLES; MONOTONE DEGRADATION PATHS; RANDOM EFFECTS; WIENER PROCESS;

RANDOM PROCESSES;

EID: 84905049555     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.2013.830074     Document Type: Article

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