A bayesian approach for system reliability analysis with multilevel pass-fail, lifetime and degradation data sets

IEEE Transactions on Reliability

Volumn 62, Issue 3, 2013, Pages 689-699

  Peng, Weiwen ^a   Huang, Hong Zhong ^a   Xie, Min ^b   Yang, Yuanjian ^a   Liu, Yu ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Bayesian reliability; multilevel heterogeneous data sets (MHDS); reliability assessment; reliability prediction

Indexed keywords

BAYESIAN APPROACHES; BAYESIAN FRAMEWORKS; BAYESIAN RELIABILITIES; HETEROGENEOUS DATA; NAVIGATION SATELLITES; RELIABILITY ASSESSMENTS; RELIABILITY ENGINEERING; RELIABILITY PREDICTION;

BAYESIAN NETWORKS; FORECASTING;

RELIABILITY ANALYSIS;

EID: 84883454058     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2013.2270424     Document Type: Article

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