A nonlinear random-coefficients model for degradation testing

Technometrics

Volumn 46, Issue 4, 2004, Pages 460-469

  Bae, Suk Joo ^a   Kvam, Paul H ^b  

^a University of Tennessee Knoxville   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

Adaptive Gaussian quadrature approximation; Plasma display panel; Reliability; Vacuum fluorescent display

Indexed keywords

ACCELERATED LIFE TESTING (ALT); ADAPTIVE GAUSSIAN QUADRATURE APPROXIMATION; PLASMA DISPLAY PANEL (PDP); VACUUM FLUORESCENT DISPLAYS (VFD);

APPROXIMATION THEORY; DEGRADATION; FLUORESCENCE; LIGHT EMITTING DIODES; NONLINEAR SYSTEMS; PLASMA DISPLAY DEVICES; RANDOM PROCESSES; STANDARDS;

TESTING;

EID: 8344270193     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017004000000464     Document Type: Article

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