A distribution-based systems reliability model under extreme shocks and natural degradation

IEEE Transactions on Reliability

Volumn 60, Issue 1, 2011, Pages 246-256

  Ye, Zhi Sheng ^a   Tang, Loon Ching ^a   Xu, Hai Yan ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SHANGHAI NORMAL UNIVERSITY   (China)

Author keywords

Brown Proschan model; extreme shock; hazard potential; multiple failure modes; natural failure

Indexed keywords

BROWN-PROSCHAN MODEL; EXTREME SHOCK; HAZARD POTENTIAL; MULTIPLE FAILURE MODES; NATURAL FAILURE;

DEGRADATION; FAILURE MODES; HAZARDS; POISSON DISTRIBUTION; RELIABILITY; SYSTEMS ANALYSIS;

COMPUTER SIMULATION;

EID: 79952194384     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2103710     Document Type: Article

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