Remaining useful life estimation based on a nonlinear diffusion degradation process

IEEE Transactions on Reliability

Volumn 61, Issue 1, 2012, Pages 50-67

  Si, Xiao Sheng ^a,b   Wang, Wenbin ^c   Hu, Chang Hua ^a   Zhou, Dong Hua ^b   Pecht, Michael G ^d,e  

^a XI'AN RESEARCH INSTITUTE OF HIGH TECHNOLOGY   (China)

^b TSINGHUA UNIVERSITY   (China)

^c University of Science and Technology Beijing   (China)

^d UNIVERSITY OF MARYLAND   (United States)

^e CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Brownian motion; degradation; diffusion process; first hitting time; maximum likelihood; nonlinear drift; remaining useful life

Indexed keywords

ANALYTICAL APPROXIMATION; CLOSED FORM; CONSTANT THRESHOLD; DEGRADATION PROCESS; DIFFUSION PROCESS; FIRST HITTING TIME; GOODNESS-OF-FIT MEASURE; NON-LINEAR MODEL; NON-LINEARITY; NONLINEAR DIFFUSION; NONLINEAR DRIFTS; PROGNOSTICS AND HEALTH MANAGEMENTS; REMAINING USEFUL LIVES; SAFETY CRITICAL SYSTEMS; THRESHOLD LEVELS; TIME-SPACE; UNKNOWN PARAMETERS; VARIABLE THRESHOLDS;

BROWNIAN MOVEMENT; DIFFUSION; MAXIMUM LIKELIHOOD; MAXIMUM LIKELIHOOD ESTIMATION;

DEGRADATION;

EID: 84862827161     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2182221     Document Type: Article

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