Modelling Accelerated Degradation Data Using Wiener Diffusion with a Time Scale Transformation

Lifetime Data Analysis

Volumn 3, Issue 1, 1997, Pages 27-45

  Whitmore, G A ^a   Schenkelberg, Fred ^b  

^a MCGILL UNIVERSITY   (Canada)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

Acceleration; Arrhenius; Degradation; Likelihood methods; Prediction; Statistical inference; Wiener process

Indexed keywords

ARTICLE; EQUIPMENT; LIFE TABLE; STATISTICAL MODEL; TIME;

EQUIPMENT FAILURE; LIFE TABLES; LIKELIHOOD FUNCTIONS; MODELS, STATISTICAL; TIME FACTORS;

EID: 0030626145     PISSN: 13807870     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009664101413     Document Type: Article

References (10)

1. M. Boulanger Carey and R. H. Koenig, "Reliability assessment based on accelerated degradation: A case study," IEEE Transactions on Reliability vol. 40(5) pp. 499-506, 1991.
2. R. S. Chhikara and J. L. Folks, The Inverse Gaussian Distribution: Theory, Methodology and Applications, Marcel Dekker: New York, 1989.
3. D. R. Cox and H. D. Miller. The Theory of Stochastic Processes, Chapman and Hall: London, 1965.
4. K. A. Doksum and A. Hóyland, "Models for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution," Technometrics vol. 34(1) pp. 74-82, 1992.
5. S. Fook Chong, A Study of Hougaard Distributions, Hougaard Processes and Applications, M.Sc. thesis, McGill University, Montreal, 1993.
6. R. A. Johnson and D. W. Wichern, Applied Multivariate Statistical Analysis, 3rd edition, Prentice-Hall: Englewood Cliffs, New Jersey, 1992.
7. M.-L. T. Lee and G. A. Whitmore, "Stochastic processes directed by randomized time," Journal of Applied Probability vol. 30 pp. 302-314, 1993.
8. J. Lu, A Reliability Model Based on Degradation and Lifetime Data, Ph.D. thesis, McGill University, Montreal, Canada, 1995.
9. J. Neter, W. Wasserman and M. H. Kutner, Applied Linear Statistical Models, 3rd edition, Irwin: Homewood, Illinois, 1990.
10. G. A. Whitmore, "Estimating degradation by a Wiener diffusion process subject to measurement error," Lifetime Data Analysis vol. 1(3) pp. 307-319, 1995.