Effect of interface atomic structure on the electronic properties of nano-sized metal-oxide interfaces

Nano Letters

Volumn 15, Issue 1, 2015, Pages 211-217

  Qin, Wei ^a,b   Hou, Jiechang ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b University of California Davis   (United States)

Author keywords

AFM; electronic properties; interface structure; metal oxide; metal semiconductor interface; TEM

Indexed keywords

ATOMS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; METALLIC COMPOUNDS; METALS; STRUCTURAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

AFM; ELECTRON TRANSFER; INTERFACE STRUCTURES; METAL OXIDE INTERFACE; METAL OXIDES; METAL SEMICONDUCTOR INTERFACE; SEMICONDUCTING OXIDE; STRUCTURE DIFFERENCE;

INTERFACE STATES;

EID: 84920999575     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl503389b     Document Type: Article

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