Tip loading effects on AFM-based transport measurements of metal-oxide interfaces

Nanotechnology

Volumn 24, Issue 39, 2013, Pages

  Hou, Jiechang ^a   Rouxel, Baptiste ^b   Qin, Wei ^a   Nonnenmann, Stephen S ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE AFM; CONTACT QUALITY; CURRENT VOLTAGE; LOADING EFFECTS; LOADING FORCE; METAL OXIDE INTERFACE; SIZE DEPENDENT; TRANSPORT MEASUREMENTS;

NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

LOADING;

EID: 84883890745     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/39/395703     Document Type: Article

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