Electric-field-induced point defect redistribution in single-crystal TiO2-x and effects on electrical transport

Acta Materialia

Volumn 86, Issue , 2015, Pages 352-360

  Moballegh, Ali ^a   Dickey, Elizabeth C ^a  

^a North Carolina State University   (United States)

Author keywords

Analytical electron microscopy; Electrical properties; Electromigration; Oxides; Point defects

Indexed keywords

CARRIER CONCENTRATION; CATHODES; DEFECTS; ELECTRIC FIELDS; ELECTRIC PROPERTIES; ELECTRODES; ELECTROMIGRATION; LEAKAGE (FLUID); OXIDE MINERALS; OXIDES; PLATINUM; PLATINUM ALLOYS; POINT DEFECTS; SCHOTTKY BARRIER DIODES; STOICHIOMETRY; TITANIUM DIOXIDE;

ANALYTICAL ELECTRON MICROSCOPY; ASYMMETRIC ELECTRODES; CATHODOLUMINESCENCE SPECTROSCOPY; DRIFT-DIFFUSION PROCESS; ELECTRIC FIELD INDUCED; EXPERIMENTAL CONDITIONS; RECTIFYING BEHAVIORS; REDISTRIBUTION PROCESS;

SINGLE CRYSTALS;

EID: 84920971124     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2014.11.032     Document Type: Article

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