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Journal of the Electrochemical Society

Volumn 157, Issue 10, 2010, Pages

Influence of the interconnection line resistance and performance of a resistive cross bar array memory

(6) Kim, Gun Hwan a Kim, Kyung Min a Seok, Jun Yeong a Lee, Min Hwan a Song, Seul Ji a Hwang, Cheol Seong a

a Seoul National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS BAR; CROSS-BAR STRUCTURES; ELECTRICAL CHARACTERIZATION; ELECTRODE MATERIAL; EXTERNAL LOADS; EXTREME CASE; HIGH OPERATION VOLTAGE; INTERCONNECT LINES; INTERCONNECTION LINES; LINE RESISTANCE; LOAD RESISTANCES; MODEL CALCULATIONS; RESET VOLTAGE; RESISTIVE SWITCHING; SET VOLTAGE; STABLE OPERATION; TIO;

PLATINUM;

EID: 77956214922 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3478143 Document Type: Article

Times cited : (28)

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