Towards prognostics of power mosfets: Accelerated aging and precursors of failure

Annual Conference of the Prognostics and Health Management Society, PHM 2010

Volumn , Issue , 2010, Pages

  Celaya, Jose R ^a   Saxena, Abhinav ^a   Wysocki, Philip ^a   Saha, Sankalita ^a   Goebel, Kai ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; MOS DEVICES; MOSFET DEVICES; SYSTEMS ENGINEERING;

ACCELERATED AGING; DEGRADATION PROCESS; FAILURE MECHANISM; IN-SITU MEASUREMENT; PHYSICS-BASED; PROGNOSTICS AND HEALTH MANAGEMENTS; RESEARCH RESULTS; THERMAL PARAMETERS;

SEMICONDUCTOR JUNCTIONS;

EID: 84920520608     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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