An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors

AUTOTESTCON (Proceedings)

Volumn , Issue , 2008, Pages 208-215

  Sonnenfeld, Greg ^a   Goebel, Kai ^a   Celaya, Jose R ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

Aging; Characterization; Damage progression; Degradation; Electronics; IGBT and MOSFET; Prognostics; Remaining useful life; Semiconductor test systems

Indexed keywords

ACTIVE FILTERS; AGILE MANUFACTURING SYSTEMS; CONCURRENCY CONTROL; DEGRADATION; ELECTRIC CONDUCTIVITY; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MOSFET DEVICES; POWER ELECTRONICS; POWER TRANSMISSION; SEMICONDUCTING INDIUM; SEMICONDUCTOR MATERIALS; SOFTWARE ARCHITECTURE;

AGING; DAMAGE PROGRESSION; ELECTRONICS; IGBT AND MOSFET; PROGNOSTICS; REMAINING USEFUL LIFE; SEMICONDUCTOR TEST SYSTEMS;

TRANSISTORS;

EID: 57949090034     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2008.4662613     Document Type: Conference Paper

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