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Volumn 24, Issue 47, 2014, Pages 7461-7466

Wafer scale synthesis and high resolution structural characterization of atomically thin MoS2 layers

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; MORPHOLOGY; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PHOTOELECTRON SPECTROSCOPY; PHOTOLUMINESCENCE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84917675017     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201402519     Document Type: Article
Times cited : (115)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.