Quantitative electrostatic force microscopy with sharp silicon tips

Nanotechnology

Volumn 25, Issue 49, 2014, Pages

  Fumagalli, L ^a   Edwards, M A ^a   Gomila, G ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

AFM; dielectric constant; dielectrics; EFM; nanoparticles; sharp tips

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; ELECTROSTATICS; NANOPARTICLES; PERMITTIVITY; PROBES; SILICON; SUBSTRATES;

DIELECTRIC NANOPARTICLES; DIELECTRIC-CONSTANT MEASUREMENTS; ELECTROSTATIC FORCE MICROSCOPY; HIGHER RESOLUTION; LATERAL RESOLUTION; METALLIC SUBSTRATE; SHARP TIP; THEORETICAL MODELLING;

ELECTRIC FORCE MICROSCOPY;

EID: 84912016430     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/49/495701     Document Type: Article

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