Multiscale modeling of the electrostatic impact of self-assembled monolayers used as gate dielectric treatment in organic thin-film transistors

ACS Applied Materials and Interfaces

Volumn 6, Issue 17, 2014, Pages 15372-15378

  Mityashin, Alexander ^a,b   Roscioni, Otello Maria ^c   Muccioli, Luca ^c   Zannoni, Claudio ^c   Geskin, Victor ^d   Cornil, Jérôme ^d   Janssen, Dimitri ^a,b,e   Steudel, Soeren ^a   Genoe, Jan ^a   Heremans, Paul ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c UNIVERSITY OF BOLOGNA   (Italy)

^d UNIVERSITY OF MONS   (Belgium)

^e Fujifilm Electronic Materials (Europe) NV   (Belgium)

Author keywords

coverage; electrostatic disorder; microelectrostatic model; molecular dynamics; onset voltage; pentacene

Indexed keywords

ELECTROSTATICS; GATE DIELECTRICS; MOLECULAR DYNAMICS; SELF ASSEMBLED MONOLAYERS; SELF ASSEMBLY; SILICA; THIN FILM CIRCUITS; THIN FILMS;

COVERAGE; MICROSCOPIC MECHANISMS; MULTI-SCALE MODELING; ONSET VOLTAGES; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; PENTACENES;

THIN FILM TRANSISTORS;

EID: 84907814126     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am503873f     Document Type: Article

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