Surface charge mapping with a nanopipette

Journal of the American Chemical Society

Volumn 136, Issue 39, 2014, Pages 13735-13744

  McKelvey, Kim ^a   Kinnear, Sophie L ^a   Perry, David ^a,b   Momotenko, Dmitry ^a   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RECTIFIERS; ELECTROLYTES; IONIC STRENGTH; IONS; MAPPING; SURFACE CHARGE;

AQUEOUS ELECTROLYTE; DIFFUSE DOUBLE LAYERS; ELECTROLYTE SOLUTIONS; LOW IONIC STRENGTH; MATERIALS CHARACTERIZATION; SCANNING ION CONDUCTANCE MICROSCOPIES; SURFACE CHARGE EFFECT; TOPOGRAPHICAL IMAGING;

SURFACE TOPOGRAPHY;

ELECTROLYTE;

ALTERNATING CURRENT; ARTICLE; ATOMIC FORCE MICROSCOPY; CYTOLOGY; ELECTRICITY; ION CONDUCTANCE; ION CURRENT; IONIC STRENGTH; NANOPIPETTE; OSCILLATION; PERIODICITY; SCANNING ELECTRON MICROSCOPY; SCANNING ION CONDUCTANCE MICROSCOPY; STEADY STATE; SURFACE CHARGE; DEVICES; ELECTROCHEMICAL ANALYSIS; ELECTRODE; NANOTECHNOLOGY; SURFACE PROPERTY;

ELECTROCHEMICAL TECHNIQUES; ELECTRODES; NANOTECHNOLOGY; SURFACE PROPERTIES;

EID: 84907487637     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja506139u     Document Type: Article

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