Comparison of scanning ion conductance microscopy with atomic force microscopy for cell imaging

Langmuir

Volumn 27, Issue 2, 2011, Pages 697-704

  Rheinlaender, Johannes ^a   Geisse, Nicholas A ^b   Proksch, Roger ^b   Schäffer, Tilman E ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b United States   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGING; CELL EXTENSION; CELL IMAGING; HIGH RESOLUTION; IMAGING FORCE; ION CONDUCTANCE; MYOBLAST CELLS; NON-CONTACT;

CELL CULTURE; MECHANICAL PROPERTIES; TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPARATIVE STUDY; CYTOLOGY; FIBROBLAST; HUMAN; LUNG; SCANNING PROBE MICROSCOPY;

FIBROBLASTS; HUMANS; LUNG; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE;

EID: 78651332851     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la103275y     Document Type: Article

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