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Volumn 76, Issue 1 I, 1999, Pages 528-538

Relative surface charge density mapping with the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRICITY; LIPID BILAYER; MOLECULAR INTERACTION; SURFACE CHARGE;

EID: 0032938319     PISSN: 00063495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0006-3495(99)77221-8     Document Type: Article
Times cited : (128)

References (34)
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