The role of pore geometry in single nanoparticle detection

ACS Nano

Volumn 6, Issue 9, 2012, Pages 8366-8380

  Davenport, Matthew ^a,b   Healy, Ken ^b,c   Pevarnik, Matthew ^b   Teslich, Nick ^a   Cabrini, Stefano ^d   Morrison, Alan P ^c   Siwy, Zuzanna S ^b   Létant, Sonia E ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY COLLEGE CORK   (Ireland)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

aspect ratio; ion current; nanoparticle; nanopore; resistive pulse

Indexed keywords

ACCESS RESISTANCE; APPLIED VOLTAGES; CRITICAL FACTORS; DETECTION SCHEME; FOCUSED ION BEAM MILLING; HIGHLY CHARGED PARTICLES; ION CURRENTS; IONIC CURRENT; PARTICLE CAPTURE; PORE GEOMETRY; PORE SURFACE; RESISTIVE-PULSE; SILICON NITRIDE MEMBRANE; SINGLE NANOPARTICLE; SPHERICAL SILICA;

ASPECT RATIO; COMPUTER SIMULATION; ELECTRIC FIELDS; GEOMETRY; NANOPARTICLES; SILICON NITRIDE; SURFACE PLASMON RESONANCE; VIRUSES; ZETA POTENTIAL;

NANOPORES;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; PARTICLE SIZE; POROSITY; ULTRASTRUCTURE;

COMPUTER SIMULATION; MATERIALS TESTING; MODELS, CHEMICAL; MODELS, MOLECULAR; NANOSTRUCTURES; PARTICLE SIZE; POROSITY;

EID: 84866715140     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn303126n     Document Type: Article

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