Scanning ion conductance microscopy: A model for experimentally realistic conditions and image interpretation

Analytical Chemistry

Volumn 81, Issue 11, 2009, Pages 4482-4492

  Edwards, Martin A ^a,b   Williams, Cara G ^a   Whitworth, Anna L ^a   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATING CURRENT; BULK SOLUTIONS; COMPREHENSIVE MODEL; CRITICAL ASSESSMENT; CURRENT FLOWS; CURRENT RESPONSE; DIRECT CURRENT; ELECTROLYTE SOLUTIONS; FEEDBACK SIGNAL; IMAGE INTERPRETATION; ION CONDUCTANCE; LAPLACE'S EQUATIONS; MODEL SUBSTRATES; NORMAL DIRECTION; PLANAR SURFACE; REALISTIC CONDITIONS; REFERENCE ELECTRODES; SCANNED PROBE; SEMIEMPIRICAL TREATMENT; SMALL AMPLITUDE; SURFACE FEATURE; TIP GEOMETRY;

ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; ENGINEERING GEOLOGY; IMAGE ANALYSIS; LAPLACE EQUATION; LAPLACE TRANSFORMS; PROBES; SCANNING; SCANNING PROBE MICROSCOPY;

SURFACE TOPOGRAPHY;

ALTERNATING CURRENT; ARTICLE; ELECTRODE; FEEDBACK SYSTEM; IMAGE ANALYSIS; ION CONDUCTANCE; SCANNING ION CONDUCTANCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODES; ELECTROLYTES; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, SCANNING PROBE; MODELS, CHEMICAL; SURFACE PROPERTIES;

EID: 66349116706     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900376w     Document Type: Article

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