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Volumn 136, Issue 1, 2011, Pages 90-97

Effects of pipette modulation and imaging distances on ion currents measured with Scanning Ion Conductance Microscopy (SICM)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 78649858297     PISSN: 00032654     EISSN: 13645528     Source Type: Journal    
DOI: 10.1039/c0an00604a     Document Type: Article
Times cited : (43)

References (34)
  • 27
    • 0347127027 scopus 로고
    • Lavalle, M.; Schanne, O. F.; Hebert, N. C., ed. John Wiley and Sons, Inc.: New York, NY
    • Lavalle, M.,;, Schanne, O. F.,;, Hebert, N. C., ed. Glass Microelectrodes; John Wiley and Sons, Inc.: New York, NY, 1969
    • (1969) Glass Microelectrodes;
  • 33
    • 0003533516 scopus 로고
    • Fleischer, R. L.; Price, P. B.; Walker, R. M., ed. University of California Press: Berkeley, CA
    • Fleischer, R. L.,;, Price, P. B.,;, Walker, R. M., ed. Nuclear Tracks in Solids; University of California Press: Berkeley, CA, 1975
    • (1975) Nuclear Tracks in Solids;
  • 34
    • 78649812066 scopus 로고    scopus 로고
    • http://gwyddion.net/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.