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Volumn 4, Issue 62, 2014, Pages 32738-32743
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BiFeO3 thin films prepared on metallic Ni tapes by chemical solution deposition: Effects of annealing temperature and a La 0.5Sr0.5TiO3 buffer layer on the dielectric, ferroelectric and leakage properties
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
BUFFER LAYERS;
DEPOSITION;
FERROELECTRICITY;
NICKEL;
THIN FILMS;
ANNEALING TEMPERATURES;
BFO THIN FILMS;
CHEMICAL SOLUTION DEPOSITION;
CHEMICAL SOLUTION DEPOSITION METHOD;
COERCIVE FIELD;
FERROELECTRIC PROPERTY;
LEAKAGE PROPERTY;
METALLIC TAPES;
FILM PREPARATION;
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EID: 84905739158
PISSN: None
EISSN: 20462069
Source Type: Journal
DOI: 10.1039/c4ra04436c Document Type: Article |
Times cited : (15)
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References (34)
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