메뉴 건너뛰기




Volumn 4, Issue 62, 2014, Pages 32738-32743

BiFeO3 thin films prepared on metallic Ni tapes by chemical solution deposition: Effects of annealing temperature and a La 0.5Sr0.5TiO3 buffer layer on the dielectric, ferroelectric and leakage properties

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BUFFER LAYERS; DEPOSITION; FERROELECTRICITY; NICKEL; THIN FILMS;

EID: 84905739158     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c4ra04436c     Document Type: Article
Times cited : (15)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.