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Journal of Applied Physics

Volumn 104, Issue 12, 2008, Pages

Thickness dependent size effect of BiFeO3 films grown on LaNiO3-buffered Si substrates

(3) Wang, Yao a Lin, Yuanhua a Nan, Ce Wen a

a TSINGHUA UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; COLLOIDS; ELECTRIC FIELDS; GELATION; HYSTERESIS; HYSTERESIS LOOPS; MAGNETIC MATERIALS; MAGNETIC MOMENTS; SUBSTRATES;

ANTIFERROMAGNETIC STATES; ANTIFERROMAGNETIC STRUCTURES; COATING PROCESSING; DOMAIN STRUCTURES; ELECTRIC FIELD HYSTERESIS LOOPS; FERROELECTRIC BEHAVIORS; MAGNETOELASTIC EFFECTS; RAMAN SPECTRUMS; SI (100) SUBSTRATES; SI SUBSTRATES; SIZE EFFECTS; SOL - GELS; STRAIN STATES; X-RAY DIFFRACTIONS;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 58149215604 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3054169 Document Type: Article

Times cited : (67)

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