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Volumn 61, Issue 5, 2013, Pages 1739-1747

Self-limited grain growth, dielectric, leakage and ferroelectric properties of nanocrystalline BiFeO3 thin films by chemical solution deposition

Author keywords

BiFeO3; Dielectric; Ferroelectric; Grain growth; Leakage

Indexed keywords

BIFEO3; CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTION DEPOSITION METHOD; COERCIVE FIELD; CONDUCTION MECHANISM; EXPONENTIAL DECAYS; FERROELECTRIC PROPERTY; FOWLER-NORDHEIM TUNNELING; GROWTH MECHANISMS; HIGH ELECTRIC FIELDS; MICRO-STRAIN; NANOCRYSTALLINES; RELAXATION MODELS; SPACE-CHARGE-LIMITED CURRENT;

EID: 84873720294     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.11.048     Document Type: Article
Times cited : (50)

References (45)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.