Heavy ions test result on a 65nm Sparc-V8 radiation-hard microprocessor

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2014, Pages

  Bottoni, C ^a,b   Glorieux, M ^a   Daveau, J M ^a   Gasiot, G ^a   Abouzeid, F ^a   Clerc, S ^a   Naviner, L ^b   Roche, P ^a  

^a STMICROELECTRONICS   (France)

^b TELECOM PARISTECH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY;

FAULT INJECTION; FINE GRAINED; RADIATION TESTS; RADIATION-HARD;

HEAVY IONS;

EID: 84905658765     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2014.6861096     Document Type: Conference Paper

References (20)

1. International Technology Roadmap for Semiconductors, 2001-2007 ed.[Online].
2. International Organization for Standardization. http://www.iso.org.
3. International Electrotechnical Commission. http://www.iec.ch/ functionalsafety/.
4. R. Velazco, S. Rezgui, and R. Ecoffet. Predicting error rate for microprocessor-based digital architectures through c.e.u. (code emulating upsets) injection. Nuclear Science, IEEE Transactions on, 47(6):2405-2411, 2000.
5. J.-M. Daveau, A. Blampey, G. Gasiot, J. Bulone, and P. Roche. An industrial fault injection platform for soft-error dependability analysis and hardening of complex system-on-a-chip. In Reliability Physics Symposium, 2009 IEEE International, pages 212-220, 2009.
6. C Ĺopez-Ongil, M. Garća-Valderas, and M. Portela-Garća. Autonomous fault evaluation emulation: A new fpga-based acceleration system for hardness evaluation. IEEE Transactions on Nuclear Science, 54(1), February 2007.
7. M. Maniatakos, N. Karimi, C. Tirumurti, A. Jas, and Y. Makris. Instruction-level impact analysis of low-level faults in a modern microprocessor controller. Computers, IEEE Transactions on, 60(9):1260-1273, sept. 2011.
8. Hyungmin Cho, S. Mirkhani, Chen-Yong Cher, J.A. Abraham, and S. Mitra. Quantitative evaluation of soft error injection techniques for robust system design. In Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE, pages 1-10, May 2013.
9. P.N. Sanda, J.W. Kellington, P Kudva, R. Kalla, R. B. McBeth, J. Ackaret, R. Lockwood, J. Schumann, and C. R. Jones. Soft-error resilience of the ibm power6 processor. IBM Journal of Research and Development, 52(3):275-284, May 2008.
10. C. Hafer, S. Griffith, S. Guertin, J. Nagy, F. Sievert, J. Gaisler, and S. Habinc. Leon 3ft processor radiation effects data. In Radiation Effects Data Workshop, 2009 IEEE, pages 148-151, 2009.
11. F. Sturesson, J. Gaisler, R. Ginosar, and T. Liran. Radiation characterization of a dual core leon3-ft processor. In Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on, pages 938-944, 2011.
12. P. Peronnard, R. Ecoffet, M. Pignol, D. Bellin, and R. Velazco. Predicting the seu error rate through fault injection for a complex microprocessor. In Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on, pages 2288-2292, 2008.
13. R. Velazco, R. Ecoffet, and F. Faure. How to characterize the problem of seu in processors representative errors observed on flight. In On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International, pages 303-308, 2005.
14. N.F. Haddad, R.D. Brown, R. Ferguson, A.T. Kelly, R.K. Lawrence, D.M. Pirkl, and J.C. Rodgers. Second generation (200mhz) rad750 microprocessor radiation evaluation. In Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on, pages 877-880, 2011.
15. Aeroflex Gaisler. http://www.gaisler.com/.
16. S. Clerc, F. Abouzeid, G. Gasiot, J.-M. Daveau, C. Bottoni, M. Glorieux, J.-L. Autran, F. Cacho, V. Huard, L. Dugoujon, R. Weigand, F. Malou, L. Hili, and P. Roche. Space radiation and reliability qualifications on 65nm cmos 600mhz microprocessors. In Reliability Physics Symposium (IRPS), 2013 IEEE International, pages 6C.1.1-6C.1.7, 2013.
17. C. Hafer, J. Mabra, D. Slocum, and T.S. Kalkur. Next generation radiation-hardened sram for space applications. In Aerospace Conference, 2006 IEEE, pages 8 pp.-, 2006.
18. Radiation Effects Facility, JYFL. https://www.jyu.fi.
19. CREME96. https://creme.isde.vanderbilt.edu.
20. A.J. Tylka, J.H. Adams, P.R. Boberg, B. Brownstein, W.F. Dietrich, E.O. Flueckiger, E.L. Petersen, M.A. Shea, D.F. Smart, and E.C. Smith. Creme96: A revision of the cosmic ray effects on micro-electronics code. Nuclear Science, IEEE Transactions on, 44(6):2150-2160, 1997.