-
1
-
-
0141836929
-
Comparison of physical and software implemented fault injection techniques
-
September
-
J. Arlat, Y. Crouzet, J. Karlsson, P. Folkesson, E. Fuchs, and G. Leber, "Comparison of physical and software implemented fault injection techniques," IEEE Transactions on Computers, vol. 52, no. 9, September 2003.
-
(2003)
IEEE Transactions on Computers
, vol.52
, Issue.9
-
-
Arlat, J.1
Crouzet, Y.2
Karlsson, J.3
Folkesson, P.4
Fuchs, E.5
Leber, G.6
-
4
-
-
44949151062
-
Reliability analysis of large circuit using scalable techniques and tools
-
November
-
D. Bhaduri, S. Shukla, P. Graham, and M. Gokhale, "Reliability analysis of large circuit using scalable techniques and tools," IEEE Transactions on Circuits and Systems, vol. 54, no. 11, November 2007.
-
(2007)
IEEE Transactions on Circuits and Systems
, vol.54
, Issue.11
-
-
Bhaduri, D.1
Shukla, S.2
Graham, P.3
Gokhale, M.4
-
5
-
-
48349128782
-
Scalable techniques and tools for reliability analysis of large circuits
-
June
-
-, "Scalable techniques and tools for reliability analysis of large circuits," in Proceeding of the 20th international Conference on VLSI Design, June 2007.
-
(2007)
Proceeding of the 20th international Conference on VLSI Design
-
-
-
7
-
-
51049121623
-
Efficient computation of logic circuit reliability based on probabilistic transfer matrix
-
March
-
L. Naviner, M. de Vasconcelos, D. Franco, and J. Naviner, "Efficient computation of logic circuit reliability based on probabilistic transfer matrix," in Proceeding of the International Conference on Design and Technology of Integrated system in Nanoscale Era, March 2008.
-
(2008)
Proceeding of the International Conference on Design and Technology of Integrated system in Nanoscale Era
-
-
Naviner, L.1
de Vasconcelos, M.2
Franco, D.3
Naviner, J.4
-
10
-
-
0034452351
-
Analysis of single-event effects in combinatorial logic - simulation of the amd2901 bitslice processor
-
December
-
L. Massengill, A. Baranski, D. V. Nort, J. Meng, and B. Bhuva, "Analysis of single-event effects in combinatorial logic - simulation of the amd2901 bitslice processor," IEEE Transactions on Nuclear Science, vol. 47, no. 6, December 2000.
-
(2000)
IEEE Transactions on Nuclear Science
, vol.47
, Issue.6
-
-
Massengill, L.1
Baranski, A.2
Nort, D.V.3
Meng, J.4
Bhuva, B.5
-
11
-
-
34548078901
-
Two complementary approaches for studying the effect of seus on digital processors
-
August
-
M. García-Valderas, P. Peronnard, C. López-Ongil, R. Ecoffet, F. Bezerra, and R. Velazco, "Two complementary approaches for studying the effect of seus on digital processors," IEEE Transactions on Nuclear Science, vol. 54, no. 4, August 2007.
-
(2007)
IEEE Transactions on Nuclear Science
, vol.54
, Issue.4
-
-
García-Valderas, M.1
Peronnard, P.2
López-Ongil, C.3
Ecoffet, R.4
Bezerra, F.5
Velazco, R.6
-
12
-
-
34548089857
-
A unified environment for fault injection at any design level based on emulation
-
august
-
C. López-Ongil, L. entrena, M. García-Valderas, M.Portela, M. Aguire, J.Tombs, V.Baena, and F. Munoz, "A unified environment for fault injection at any design level based on emulation," IEEE Transactions on Nuclear Science, vol. 54, no. 4, august 2007.
-
(2007)
IEEE Transactions on Nuclear Science
, vol.54
, Issue.4
-
-
López-Ongil, C.1
entrena, L.2
García-Valderas, M.3
Portela, M.4
Aguire, M.5
Tombs, J.6
Baena, V.7
Munoz, F.8
-
13
-
-
33847733939
-
Autonomous fault evaluation emulation: A new fpga-based acceleration system for hardness evaluation
-
February
-
C. López-Ongil, M. García-Valderas, and M.Portela-García, "Autonomous fault evaluation emulation: A new fpga-based acceleration system for hardness evaluation," IEEE Transactions on Nuclear Science, vol. 54, no. 1, February 2007.
-
(2007)
IEEE Transactions on Nuclear Science
, vol.54
, Issue.1
-
-
López-Ongil, C.1
García-Valderas, M.2
Portela-García, M.3
-
14
-
-
33845380514
-
Fault injection based reliability evaluation of sopc's
-
May
-
M. S. Reorda, L. Sterpone, M. Violante, M. Portela-García, C. López-Ongil, and L. Entrena, "Fault injection based reliability evaluation of sopc's," in Proceeding of the 11th IEEE European Test symposium, May 2006.
-
(2006)
Proceeding of the 11th IEEE European Test symposium
-
-
Reorda, M.S.1
Sterpone, L.2
Violante, M.3
Portela-García, M.4
López-Ongil, C.5
Entrena, L.6
-
15
-
-
45749142459
-
Phaser: Phased methodology for modeling the system-level effects of soft errors
-
May
-
J. Rivers, P. Bose, P. Kudva, J. Wellman, P. Sanda, E. Cannon, and L. Alves, "Phaser: Phased methodology for modeling the system-level effects of soft errors," IBM Journal of Research and Development, vol. 52, no. 3, May 2008.
-
(2008)
IBM Journal of Research and Development
, vol.52
, Issue.3
-
-
Rivers, J.1
Bose, P.2
Kudva, P.3
Wellman, J.4
Sanda, P.5
Cannon, E.6
Alves, L.7
-
16
-
-
0029252185
-
Estimators for fault tolerance coverage evaluation
-
February
-
D. Powell, E. Martins, J. Arlat, and Y. Crouzet, "Estimators for fault tolerance coverage evaluation," IEEE Transactions on Computers, vol. 44, no. 2, February 1995.
-
(1995)
IEEE Transactions on Computers
, vol.44
, Issue.2
-
-
Powell, D.1
Martins, E.2
Arlat, J.3
Crouzet, Y.4
-
17
-
-
37249088963
-
Multiple cell upsets as the key contribution to the total ser of 65nm cmos srams and its dependence on well engineering
-
July
-
G. Gasiot, D. Giot, and P. Roche, "Multiple cell upsets as the key contribution to the total ser of 65nm cmos srams and its dependence on well engineering," in Proceeding of the Nuclear and Space Radiation Effects Conference, July 2007.
-
(2007)
Proceeding of the Nuclear and Space Radiation Effects Conference
-
-
Gasiot, G.1
Giot, D.2
Roche, P.3
-
18
-
-
70449097918
-
-
M. Galassi and all, GNU Scientific Library, http://www.gnu.org/ software/gsl/.
-
M. Galassi and all, GNU Scientific Library, http://www.gnu.org/ software/gsl/.
-
-
-
-
20
-
-
0032592909
-
Coverage evaluation methods for stratified fault injection
-
July
-
M. Cukier, D. Powell, and J. Arlat, "Coverage evaluation methods for stratified fault injection," IEEE Transactions on Computers, vol. 48, no. 7, July 1999.
-
(1999)
IEEE Transactions on Computers
, vol.48
, Issue.7
-
-
Cukier, M.1
Powell, D.2
Arlat, J.3
-
21
-
-
20344396012
-
Organizational research: Determining appropriate sample size in survey research
-
spring
-
J. Barlett, J. Kotrlik, and C. Higgins, "Organizational research: Determining appropriate sample size in survey research," Information Technology, Learning, and Performance Journal, vol. 19, no. 1, spring 2001.
-
(2001)
Information Technology, Learning, and Performance Journal
, vol.19
, Issue.1
-
-
Barlett, J.1
Kotrlik, J.2
Higgins, C.3
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