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Volumn , Issue , 2009, Pages 212-220

An industrial fault injection platform for soft-error dependability analysis and hardening of complex system-on-a-chip

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIZE; COMPLEX SYSTEMS; CONFORMANCE TESTING; DEPENDABILITY ANALYSIS; EMULATION PLATFORM; FAULT COVERAGES; FAULT INJECTION; HARDWARE EMULATION; SAFETY ANALYSIS; SAFETY REQUIREMENTS; SOC VERIFICATION;

EID: 70449102741     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173253     Document Type: Conference Paper
Times cited : (37)

References (24)
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    • -, "Scalable techniques and tools for reliability analysis of large circuits," in Proceeding of the 20th international Conference on VLSI Design, June 2007.
    • (2007) Proceeding of the 20th international Conference on VLSI Design
  • 10
    • 0034452351 scopus 로고    scopus 로고
    • Analysis of single-event effects in combinatorial logic - simulation of the amd2901 bitslice processor
    • December
    • L. Massengill, A. Baranski, D. V. Nort, J. Meng, and B. Bhuva, "Analysis of single-event effects in combinatorial logic - simulation of the amd2901 bitslice processor," IEEE Transactions on Nuclear Science, vol. 47, no. 6, December 2000.
    • (2000) IEEE Transactions on Nuclear Science , vol.47 , Issue.6
    • Massengill, L.1    Baranski, A.2    Nort, D.V.3    Meng, J.4    Bhuva, B.5
  • 13
    • 33847733939 scopus 로고    scopus 로고
    • Autonomous fault evaluation emulation: A new fpga-based acceleration system for hardness evaluation
    • February
    • C. López-Ongil, M. García-Valderas, and M.Portela-García, "Autonomous fault evaluation emulation: A new fpga-based acceleration system for hardness evaluation," IEEE Transactions on Nuclear Science, vol. 54, no. 1, February 2007.
    • (2007) IEEE Transactions on Nuclear Science , vol.54 , Issue.1
    • López-Ongil, C.1    García-Valderas, M.2    Portela-García, M.3
  • 17
    • 37249088963 scopus 로고    scopus 로고
    • Multiple cell upsets as the key contribution to the total ser of 65nm cmos srams and its dependence on well engineering
    • July
    • G. Gasiot, D. Giot, and P. Roche, "Multiple cell upsets as the key contribution to the total ser of 65nm cmos srams and its dependence on well engineering," in Proceeding of the Nuclear and Space Radiation Effects Conference, July 2007.
    • (2007) Proceeding of the Nuclear and Space Radiation Effects Conference
    • Gasiot, G.1    Giot, D.2    Roche, P.3
  • 18
    • 70449097918 scopus 로고    scopus 로고
    • M. Galassi and all, GNU Scientific Library, http://www.gnu.org/ software/gsl/.
    • M. Galassi and all, GNU Scientific Library, http://www.gnu.org/ software/gsl/.
  • 20
    • 0032592909 scopus 로고    scopus 로고
    • Coverage evaluation methods for stratified fault injection
    • July
    • M. Cukier, D. Powell, and J. Arlat, "Coverage evaluation methods for stratified fault injection," IEEE Transactions on Computers, vol. 48, no. 7, July 1999.
    • (1999) IEEE Transactions on Computers , vol.48 , Issue.7
    • Cukier, M.1    Powell, D.2    Arlat, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.