Space radiation and reliability qualifications on 65nm CMOS 600MHz microprocessors

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2013, Pages

  Clerc, Sylvain ^a   Abouzeid, Fady ^a   Gasiot, Gilles ^a   Daveau, Jean Marc ^a   Bottoni, Cyril ^a   Glorieux, Maximilien ^a   Autran, Jean Luc ^b   Cacho, Florian ^a   Huard, Vincent ^a   Dugoujon, Laurent ^a   Weigand, Roland ^c   Malou, Florence ^d   Hili, Laurent ^a   Roche, Philippe ^a  

^a STMICROELECTRONICS   (France)

^b CNRS   (France)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

65NM CMOS; BULK PROCESS; COST EFFECTIVE DESIGN; NEW TECHNOLOGIES; RELIABILITY QUALIFICATION; SPACE PROGRAMS; SPACE RADIATIONS;

ENERGY EFFICIENCY;

MICROPROCESSOR CHIPS;

EID: 84880971013     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2013.6532051     Document Type: Conference Paper

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