LEON 3FT processor radiation effects data

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2009, Pages 148-151

  Hafer, C ^a   Griffith, S ^a   Guertin, S ^b   Nagy, J ^a   Sievert, F ^a   Gaisler, J ^c   Habinc, S ^c  

^a Gaisler Research   (United Kingdom)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c Aeroflex Gaisler   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT-TOLERANT; SINGLE-BIT;

IONIZING RADIATION; NANOTECHNOLOGY; TECHNICAL PRESENTATIONS;

RADIATION EFFECTS;

EID: 77950956910     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2009.5336299     Document Type: Conference Paper

References (5)

1. J. Nagy, C. Hafer, S. Griffith, A. Jordan, "LEON 3 Fault Tolerant Microprocessor," 2009 HEART
2. Kleinbaum, Kupper, "Applied Regression Analysis and Other Multivariable Methods," 1978 by Wadsworth Publishing Company, p. 18
3. A. Jordan, C. Hafer, J. Mabra, S. Griffith, J. Nagy, M. Lahey, D. Harris, "SEU Data and Fault Tolerance Analysis of a LEON 3FT Processor," abstract accepted at 2009 RADECS
4. https://creme96.nrl.navy.mil/
5. http://www.spacerad.com/