Second generation (200MHz) RAD750 microprocessor radiation evaluation

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2011, Pages 877-880

  Haddad, Nadim F ^a   Brown, Ronald D ^a   Ferguson, Richard ^a   Kelly, Andrew T ^a   Lawrence, Reed K ^a   Pirkl, Daniel M ^a   Rodgers, John C ^a  

^a BAE SYSTEMS   (United States)

Author keywords

Ion Radiation Effects; Microprocessor; Radiation Effects; Radiation Hardening; Space Technology

Indexed keywords

BAE SYSTEMS; ION RADIATION EFFECTS; POWERPC; PROCESS TECHNOLOGIES; RADIATION ENVIRONMENTS; RADIATION TOLERANCES; RADIATION-HARDENED; SECOND GENERATION; SPACE TECHNOLOGIES;

MICROPROCESSOR CHIPS; RADIATION HARDENING;

RADIATION EFFECTS;

EID: 84860159982     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2011.6131320     Document Type: Conference Paper

References (5)

1. Richard W. Berger et al., "The RAD750™ - A Radiation Hardened PowerPC™ Processor for High Performance Spaceborne Applications," IEEE Aerospace Conference, 2001.
2. Nadim F. Haddad, et al., "Eliminating Low LET Sensitivities in Deep Sub-Micrometer SRAM through Non-intrusive Technology Features," RADECS 2006 Workshop Proceedings, pp. 14-17.
3. MIL-STD-883 test method 1019 section 3.12.2
4. ESCC 22900
5. James H. Adams, "The Natural Radiation Environment Inside Spacecraft," IEEE Transactions on Nuclear Science, Vol. NS- 29, No. 6, December 1982.