Predicting the SEU error rate through fault injection for a complex microprocessor

IEEE International Symposium on Industrial Electronics

Volumn , Issue , 2008, Pages 2288-2292

  Peronnard, P ^a   Ecoffet, R ^b   Pignol, M ^b   Bellin, D ^c   Velazco, R ^a  

^a TIMA LABORATORY   (France)

^b CNES   (France)

^c e2v Semiconductors ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; ELECTRIC NETWORK ANALYSIS; SOFTWARE TESTING; URANIUM POWDER METALLURGY;

COMPLEX PROCESSORS; ERROR RATES; FAULT INJECTIONS; MICRO-PROCESSORS; PREDICTED ERRORS;

INDUSTRIAL ELECTRONICS;

EID: 57849085401     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2008.4677290     Document Type: Conference Paper

References (12)

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