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Volumn 24, Issue 29, 2014, Pages 4689-4697

Gate capacitance-dependent field-effect mobility in solution-processed oxide semiconductor thin-film transistors

Author keywords

disordered oxide semiconductors; field effect mobility; gate insulators; solution processed oxide semiconductors; thin film transistors

Indexed keywords

CAPACITANCE; DIELECTRIC MATERIALS; THIN FILM TRANSISTORS; ZINC OXIDE;

EID: 84905506470     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201400588     Document Type: Article
Times cited : (92)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.