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Volumn 58, Issue 7, 2013, Pages 203-208

Fundamentals in MoS2 transistors: Dielectric, scaling and metal contacts

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; CONTACTS (FLUID MECHANICS); MICROELECTRONICS; OPTOELECTRONIC DEVICES;

EID: 84904916692     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/05807.0203ecst     Document Type: Conference Paper
Times cited : (19)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.