The origins and limits of metal-graphene junction resistance

Nature Nanotechnology

Volumn 6, Issue 3, 2011, Pages 179-184

  Xia, Fengnian ^a   Perebeinos, Vasili ^a   Lin, Yu Ming ^a   Wu, Yanqing ^a   Avouris, Phaedon ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTICS; CONTACT RESISTANCE; EFFICIENCY; GRAPHENE; PALLADIUM; TEMPERATURE DISTRIBUTION;

BALLISTIC TRANSPORTS; GRAPHENE JUNCTIONS; METALLIC CONTACTS; PALLADIUM CONTACTS; TEMPERATURE DECREASE; TEMPERATURE DEPENDENCE; TEMPERATURE INCREASE; TRANSFER EFFICIENCY;

GRAPHENE TRANSISTORS;

GRAPHENE; METAL; PALLADIUM;

ARTICLE; FIELD EFFECT TRANSISTOR; PRIORITY JOURNAL; TEMPERATURE;

EID: 79952445612     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2011.6     Document Type: Article

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