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Journal of the Electrochemical Society

Volumn 161, Issue 5, 2014, Pages

Measurement of stress changes during growth and dissolution of anodic oxide films on aluminum

(3) Çapraz, Ömer Özgür a Shrotriya, Pranav a Hebert, Kurt R a

a Iowa State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DISSOLUTION; OXIDE FILMS;

ANODIC OXIDE FILM; DEPTH DISTRIBUTION; DISSOLUTION RATES; ELECTROSTATIC STRESS; METAL OXIDE INTERFACE; OPEN-CIRCUIT DISSOLUTION; OXIDE DISSOLUTION; STRESS GENERATION;

ANODIC OXIDATION;

EID: 84904800062 PISSN: 00134651 EISSN: 19457111 Source Type: Journal
DOI: 10.1149/2.057405jes Document Type: Article

Times cited : (27)

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