Microscopic observations of voids in anodic oxide films on aluminum

Journal of the Electrochemical Society

Volumn 151, Issue 7, 2004, Pages

  Huang, R ^a   Hebert, K R ^a   Chumbley, L S ^b  

^a Iowa State University   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ALUMINA; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CAPACITORS; CRYSTALLIZATION; DENSIFICATION; DISSOLUTION; ETCHING; FILM GROWTH; GRAIN SIZE AND SHAPE; MORPHOLOGY; POSITRON ANNIHILATION SPECTROSCOPY; SODIUM COMPOUNDS; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY;

ANODIC ETCHING; ANODIC FILMS; ANODIC OXIDE FILMS; INTERFACIAL VOIDS;

METALLIC FILMS;

EID: 3242700804     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1753582     Document Type: Article

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