The mechanism of stress generation during the growth of anodic oxide films on pure aluminium in acidic solutions

Electrochimica Acta

Volumn 43, Issue 21-22, 1998, Pages 3117-3126

  Moon, Sung Mo ^a   Pyun, Su Il ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

a.c. Impedance spectroscopy; Aluminium; Anodic oxide film; Beam deflection technique; Stress

Indexed keywords

ALUMINUM; ANODIC OXIDATION; COMPRESSIVE STRESS; CURRENT DENSITY; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; FILM GROWTH; OXIDATION; SPECTROSCOPY; SULFURIC ACID;

AC IMPEDANCE SPECTROSCOPY; ALUMINIUM VACANCY; ANODIC OXIDE FILM; BEAM DEFLECTION TECHNIQUE;

ELECTROCHEMISTRY;

EID: 0032317086     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(97)10194-3     Document Type: Article

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