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Volumn 156, Issue 8, 2009, Pages

A model for coupled electrical migration and stress-driven transport in anodic oxide films

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC ALUMINUM OXIDE FILMS; ANODIC FILMS; ANODIC OXIDE FILM; AVERAGE STRESS; ELECTRICAL MIGRATION; EXPERIMENTAL MEASUREMENTS; GALVANOSTATIC; HIGH-FIELD CONDUCTION; ION MIGRATION; MECHANICAL STRESS; METAL ION TRANSPORT; METAL-FILM INTERFACES; ORDER OF MAGNITUDE; QUANTITATIVE AGREEMENT; QUANTITATIVE INTERPRETATION; STRESS-THICKNESS; TRANSPORT NUMBER; VISCOELASTIC CREEP; VOLUME CHANGE;

EID: 67650569179     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3151835     Document Type: Article
Times cited : (55)

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