O18 tracer study of porous film growth on aluminum in phosphoric acid

Journal of the Electrochemical Society

Volumn 157, Issue 11, 2010, Pages

  Baron Wiechec A ^a   Ganem, J J ^b   Garcia Vergara, S J ^c   Skeldon, P ^a   Thompson, G E ^a   Vickridge, I C ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b INSTITUT DES NANOSCIENCES DE PARIS   (France)

^c Univesidad Industrial de Santander   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC FILMS; ANODIZATIONS; ANODIZING VOLTAGE; BARRIER LAYERS; CONSTANT CURRENT; ELECTROPOLISHED; INNER REGION; POROUS FILM; PRE-FORMED OXIDE; SURFACE REGION; SURFACE TEXTURES; TRACER STUDY;

ALUMINUM; ANODIC OXIDATION; PHOSPHORIC ACID; TEXTURES;

FILM GROWTH;

EID: 77957699107     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3490640     Document Type: Article

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