Structure and property of anodic barrier films formed on aluminum in low voltage range

Electrochimica Acta

Volumn 50, Issue 25-26 SPEC. ISS., 2005, Pages 5103-5110

  Ono, Sachiko ^a   Wada, Chieko ^a   Asoh, Hidetaka ^a  

^a KOGAKUIN UNIVERSITY   (Japan)

Author keywords

Aluminum; Anodic film; Electric field strength; TEM; Transport number

Indexed keywords

ALUMINA; ALUMINUM; ANODIC OXIDATION; DISSOLUTION; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; TRANSMISSION ELECTRON MICROSCOPY;

ANODIC FILMS; DISSOLUTION RATE; ELECTRIC FIELD STRENGTH; TRANSPORT NUMBER;

THIN FILMS;

EID: 24344432781     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.04.047     Document Type: Conference Paper

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