Structural transformations of TiO2 films with deposition temperature and electrical properties of nanostructure n-TiO2/p-Si heterojunction diode

Journal of Alloys and Compounds

Volumn 613, Issue , 2014, Pages 330-337

  Aksoy, Seval ^a   Caglar, Yasemin ^a  

^a ANADOLU UNIVERSITY   (Turkey)

Author keywords

Conduction mechanism; Ideality factor; Nanostructure; Sol gel spin coating

Indexed keywords

COATINGS; DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; FIELD EMISSION MICROSCOPES; HETEROJUNCTIONS; NANOSTRUCTURES; OXIDE FILMS; OXIDE MINERALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SILICON; SOL-GEL PROCESS; SOLS; X RAY DIFFRACTION;

CONDUCTION MECHANISM; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; IDEALITY FACTORS; SEMICONDUCTOR ELECTRONIC DEVICES; SOL-GEL SPIN COATING; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; STRUCTURAL TRANSFORMATION; TIO;

TITANIUM DIOXIDE;

EID: 84903834910     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2014.05.192     Document Type: Article

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