Annealing effects on microstructural and optical properties of Nanostructured-TiO2 thin films prepared by sol-gel technique

Current Applied Physics

Volumn 12, Issue 2, 2012, Pages 422-428

  Ben Naceur, J ^a   Gaidi, M ^a   Bousbih, F ^a   Mechiakh, R ^a,b   Chtourou, R ^a  

^a RESEARCH AND TECHNOLOGY CENTER OF ENERGY   (Tunisia)

^b UNIVERSITY OF BATNA   (Algeria)

Author keywords

Atomic force microscopy; Raman spectroscopy; Spectroscopy ellipsometry; Thermal gravimetric analyses (TGA); Titanium dioxide (TiO2)

Indexed keywords

AFM; ANATASE PHASE; ANNEALING EFFECTS; ANNEALING TEMPERATURES; HIGH TRANSPARENCY; MICRO-STRUCTURAL; MICROSTRUCTURAL PROPERTIES; NANO-CRYSTALLINE STRUCTURES; OPTOELECTRONIC PROPERTIES; PHASE TRANSFORMATION; PHOTOCATALYTIC ACTIVITIES; QUARTZ SUBSTRATE; SOL-GEL TECHNIQUE; THERMAL GRAVIMETRIC ANALYSES (TGA); THERMAL GRAVIMETRIC ANALYSIS; TIO; VISIBLE RANGE;

ANNEALING; ATOMIC FORCE MICROSCOPY; GELS; GRAVIMETRIC ANALYSIS; OIL SHALE; OPTICAL CONSTANTS; OPTICAL PROPERTIES; OXIDES; PHOTOCATALYSIS; QUARTZ; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SOL-GEL PROCESS; SOL-GELS; SOLS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; TITANIUM; TITANIUM DIOXIDE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FILM PREPARATION;

EID: 81155133818     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.07.041     Document Type: Article

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