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Volumn 75, Issue 3, 2010, Pages 1073-1077
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Influence of surfactant and annealing temperature on optical properties of sol-gel derived nano-crystalline TiO2 thin films
a
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Author keywords
Optical properties; PEG; SEM; Sol gel process; TiO2 thin films; XRD
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Indexed keywords
ANNEALING TEMPERATURES;
DOPED-TIO;
ELLIPSOMETRIC MEASUREMENTS;
NANOCRYSTALLINES;
OPTICAL TRANSMITTANCE;
PEG;
SEM;
SILICON SUBSTRATES;
SOL-GEL SPIN COATING;
TIO;
TITANIUM DIOXIDE THIN FILM;
VISIBLE SPECTRAL RANGE;
XRD;
ANNEALING;
CRYSTALLINE MATERIALS;
GELS;
LIGHT REFRACTION;
MAGNETIC FILMS;
NANOSTRUCTURED MATERIALS;
OPTICAL CONSTANTS;
POLYETHYLENE GLYCOLS;
POLYETHYLENE OXIDES;
REFRACTIVE INDEX;
REFRACTOMETERS;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SPIN GLASS;
SURFACE ACTIVE AGENTS;
THIN FILMS;
TITANIUM;
TITANIUM DIOXIDE;
X RAY DIFFRACTION;
OPTICAL FILMS;
GLASS;
NANOPARTICLE;
SILICON;
SURFACTANT;
TITANIUM;
TITANIUM DIOXIDE;
ARTICLE;
CHEMISTRY;
CRYSTALLIZATION;
GEL;
METHODOLOGY;
OPTICS;
PHOTOCHEMISTRY;
REFRACTOMETRY;
SURFACE PROPERTY;
TEMPERATURE;
X RAY DIFFRACTION;
CRYSTALLIZATION;
GELS;
GLASS;
NANOPARTICLES;
OPTICS AND PHOTONICS;
PHOTOCHEMISTRY;
REFRACTOMETRY;
SILICON;
SURFACE PROPERTIES;
SURFACE-ACTIVE AGENTS;
TEMPERATURE;
TITANIUM;
X-RAY DIFFRACTION;
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EID: 76649121823
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2009.12.057 Document Type: Article |
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Times cited : (35)
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References (27)
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