High-throughput ptychography using Eiger: Scanning X-ray nano-imaging of extended regions

Optics Express

Volumn 22, Issue 12, 2014, Pages 14859-14870

  Guizar Sicairos, Manuel ^a   Johnson, Ian ^a   Diaz, Ana ^a   Holler, Mirko ^a   Karvinen, Petri ^a   Stadler, Hans Christian ^a   Dinapoli, Roberto ^a   Bunk, Oliver ^a   Menzel, Andreas ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS;

COHERENT DIFFRACTIVE IMAGING; FIELD OF VIEWS; HIGH FRAME RATE; HIGH-THROUGHPUT; INTEGRATED ELECTRONICS; PHOTON COUNTING; SCANNING SYSTEMS; SHARING INFORMATION;

OPTICS;

EID: 84902989796     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.014859     Document Type: Article

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